Degeneration of CMOS Power Cells After Hot-Carrier and Load Mismatch Stresses
نویسندگان
چکیده
منابع مشابه
Hot-carrier reliability evaluation for CMOS devices and circuits
As CMOS scaling continues, the traditional DC device-level hot-carrier reliability criteria becomes difficult to meet for newer generations of technology. In order to satisfy hot-carrier reliability requirements by using AC circuit-level criteria, issues of AC device degradation under circuit operation and impact of device degradation on circuit performance need to be examined. In order to sati...
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ژورنال
عنوان ژورنال: IEEE Electron Device Letters
سال: 2008
ISSN: 0741-3106
DOI: 10.1109/led.2008.2001700